Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques

Description

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.
The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

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1. Ebooks list page : 2002
2. Bharat Bhushan, Harald Fuchs - Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (Repost)
3. Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (NanoScience and Technology)
4. Applied Scanning Probe Methods V & VI
5. Applied Scanning Probe Methods V & VI
6. Applied Scanning Probe Methods XII: Characterization
7. Applied Scanning Probe Methods XIII: Biomimetics and Industrial Applications
8. Applied Scanning Probe Methods X: Biomimetics and Industrial Applications (NanoScience and Technology)
9. Exploring Scanning Probe Microscopy with MATHEMATICA
10. Exploring Scanning Probe Microscopy with MATHEMATICA
11. Exploring Scanning Probe Microscopy with MATHEMATICA
12. Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents
13. Scanning Probe Microscopes: Applications in Science and Technology By: K.S. Birdi (2003)
14. Scanning Microscopy for Nanotechnology: Techniques and Applications
15. Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces
16. Atomic Force Microscopy/Scanning Tunneling Microscopy 3