CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

ISBN: 1402083629

Category: Technical

Tag: Science/Engineering


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470 views since 2008-06-03, updated at 2009-06-30. Bookmark this: CMOS SRAM Circuit Design and Parametric Test in Nano Scaled Technologies Process Aware SRAM Design and Test

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Andrei Pavlov, Manoj Sachdev “CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test"
Springer | 2008-06 | ISBN: 1402083629 | 200 pages | PDF | 5 MB

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