[request_ebook] EMP III: USING IMPERFECT DATA

If your data is not perfect, you need this book! 316 Pages immediately tells you that "EMP III" is way more than a new edition of the old green book. This is a whole new book! "EMP III" expands and updates the classic procedures. It also goes beyond these procedures to include the explanations of why the procedures work. Additionally, it includes a new way of characterizing measurement systems and provides illustrations of problems with the traditional techniques.

Nearly 30 Reasons why you need "EMP III":

• Your data are less than perfect.
• Your data are never going to be perfect.
• You need to quit messing with the measurement system and get the job done!
• Learn how to do an Honest Gauge R&R Study.
• Learn how to characterize each application of a measurement system.
• Discover the difference between Observational Studies and Experimental Studies and the different types of analyses used for each.
• Learn how to place Censored Data on a Process Behavior Chart.
• Learn how some measurement system applications will only let you detect process deterioration while others will let you detect both deterioration and improvement.
• Learn how to distinguish between four different ways we use measurements.
• Learn to use a Consistency Chart to track a measurement system, characterize measurement uncertainty, and check for bias in the measurements.
• Learn how to evaluate destructive tests.
• Learn how to use Consistency Charts with Subjective Measurements.
• Discover what each of the values produced by a traditional Gauge R&R Study actually represents.
• Discover why the Probable Error defines the effective resolution of a measurement.
• Learn how Chunky Data affects the charts.
• Learn how using the appropriate measurement increment can eliminate the problems of Chunky Data.
• Learn how to use multiple determinations in Short EMP Studies.
• Discover the four different paths through a Basic EMP Study, using the NEW Flowchart.
• Incorporate ANOME and ANOMR techniques into your Basic EMP Study.
• Benefit from new guidelines for assessing the parallelism in EMP Studies.
• Learn how to do Two-Factor EMP Studies with nuisance components that are crossed or nested.
• Discover the full explanation of the basis for manufacturing specifications.
• Benefit from new explanations of the problems of Prediction and Representation.
• Discover the role and scope of Acceptance Sampling.
• Learn how to use the concept of a Grand Lot.

64 Examples and Case Histories.